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Bias Temperature Instability for Devices and Circuits
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Barnes and Noble
Bias Temperature Instability for Devices and Circuits
Current price: $169.99
Barnes and Noble
Bias Temperature Instability for Devices and Circuits
Current price: $169.99
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Size: Hardcover
*Product Information may vary - to confirm product availability, pricing, and additional information please contact Barnes and Noble
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, shastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
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