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Electromigration in Thin Films and Electronic Devices: Materials and Reliability
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Barnes and Noble
Electromigration in Thin Films and Electronic Devices: Materials and Reliability
Current price: $255.00
Barnes and Noble
Electromigration in Thin Films and Electronic Devices: Materials and Reliability
Current price: $255.00
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Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. "Electromigration in Thin Films and Electronic Devices" provides an up-to-date review of key topics in this commercially important area.
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